International Journal of Modern Physics and Applications
Articles Information
International Journal of Modern Physics and Applications, Vol.1, No.2, May 2015, Pub. Date: May 23, 2015
Effect of Temperature and Hydrostatic Pressure on Films Based on MWCNT
Pages: 39-44 Views: 4177 Downloads: 941
Authors
[01] A. A. Babaev, Amirkhanov Institute of Physics, Daghestan Scientific Center, Russian Academy of Science, Makhachkala, Russia.
[02] R. K. Arslanov, Amirkhanov Institute of Physics, Daghestan Scientific Center, Russian Academy of Science, Makhachkala, Russia.
[03] P. P. Khokhlachev, Amirkhanov Institute of Physics, Daghestan Scientific Center, Russian Academy of Science, Makhachkala, Russia.
[04] T. R. Arslanov, Amirkhanov Institute of Physics, Daghestan Scientific Center, Russian Academy of Science, Makhachkala, Russia.
[05] A. K. Filippov, “PLASMAS” Limited Company, Saint-Petersburg, Russia.
[06] E. I. Terukov, Ioffe Physical-Technical Institute, Russian Academy of Science, Saint-Petersburg, Russia.
Abstract
We present a study on the electrical behavior of polymer composites based on multi-walled carbon nanotubes (MWCNT) under the application of temperature and hydrostatic pressure. An unstable behavior of the composite film structure upon cyclic heating has been observed. It has been found that the resistivity has maxima at T ≈ 340 and ≈420 K, which are responsible for intrinsic defects. The current–voltage characteristics have been studied in the stationary and pulsed modes at different temperatures. Our observations also show that pressure-induced a structural change of the MWCNT to an ellipsoid shape at P~1.5 GPa, a measurement that correlates rather well with theoretical predictions. By direct and reverse high-pressure measurements of resistance, as well as current-voltage characteristics, we have identified reversibility of electrophysical properties.
Keywords
Multi-Walled Carbon Nanotubes, High Pressure, Currient-Voltage Characteristics
References
[01] Iijima, S. (1991) Nature (London) 354, 56-58.
[02] Charlier, J. - Ch.,Blase, X. and Roche, S. (2007) Reviews of Modern Physics. 79, 677-732.
[03] Mühl, T. Elefant, D.,Graff, A.,Kozhuharova, R. ,Leonhardt, A. Mönch, I. Ritschel, M. Simon, P.,Groudeva-Zotova S.and Schneider, C.M. (2003) Journal of Applied Physics 93, 7894-7896.
[04] Zhao, B., Mönch, I., Vinzelberg, H. Mühl T. and Schneider, C. M. (2002) Applied Physics Letters 80, 3144-3146.
[05] Thamankar, R. Niyogi, S.,Yoo, B.Y.,Rheem, Y.W.,Myung, N. V.,Haddon, R.C. and Kawakamia, R.K. (2006) Applied Physics Letters 89, 033119-3.
[06] M. Kaempgen, C. K. Chan, J. Ma, Y. Cui, and G. Gruner, Nano Lett. 9, 1872 (2009).
[07] M. W. Rowell, M. A. Topinka, M. D. McGehee, H. J. Prall, G. Dennler, and N. S. Sariciftci, Appl. Phys Lett. 88, 233506 (2006).
[08] C. Feng, K. Liu, J. S. Wu, L. Liu, J. S. Cheng, and Y. Y. Zhang, Adv. Funct. Mater. 20, 885 (2010).
[09] M. Zhang, S. L. Fang, A. A. Zakhidov, S. B. Lee, and A. E. Aliev, Science (Washington) 309, 1215 (2005).
[10] Monteverde, M.,Garbarino, G.,Núñez-Regueiro, M.,Souletie, J.,Acha, C.,Jing, X.,Lu, L.,Pan, Z.W.,Xie, S.S. and Egger, R. (2006) Physical Review Letters 97, 176401-4.
[11] Tang, D.S., Bao, Z.X., Wang, L.J.,Chen, L.C.,Sun, L.F.,Liu, Z.Q.,Zhou, W.Y.,Xie, S.S.,(2000) Journal of Physics and Chemistry of Solids 61 1175-1178.
[12] Whitby, R.L.D., Gun’ko, V.M., Fukuda, T., Maekawa, T. (2010) Carbon 48, 3635-3658.
[13] Reich, S.,Thomsen, C. and Ordejón, P. (2002) Physical Review B 65, 153407-4.
[14] Pan, L.,Chortos, A.,Yu, G.,Wang, Y.,Isaacson, S.,Allen, R.,Shi, Yi.,Dauskardt R. and Bao, Zh. (2014) Nature Communication 5:3002 doi: 10.1038/ncomms4002
[15] Machado, W.S., Athayde, P.L., Mamo, M.A., van Otterlo, W.A.L., Coville, N.J., Hümmelgen, I.A. (2010) Organic Electronics 11 1736-1739.
[16] Fung, C.K.M., Zhang, M.Q.H., Chan, R.H.M.,Li,W.J.(2005)IEEE MEMS 2005, 251-254. (doi: 10.1109/MEMSYS.2005.1453914).
[17] Hu, C.H.,Liu,C.H.,Chen, L.Z.,Peng, Y. C. and Fan, S.S.(2008) Applied Physics Letters 93, 033108-3.
[18] Wang, P.,Geng, Sh.,Ding, T. (2010)Composites Science and Technology 70 1571-1573.
[19] Tangney, P., Capaz, R.B., Spataru, C.D., Cohen M.L. and Louie, S.G. (2005) Nano Letters 5, 2268-2273.
[20] Tang, J., Qin, L.-Ch., Sasaki, T., Yudasaka, M., Matsushita, A. and Iijima, S. (2000) Physical Review Letters 85, 1887-1889.
[21] ShimaH. and Sato, M. (2009) Physica Status Solidi A 206, 10, 2228-2233.
[22] Shima, H.,Ghosh, S.,Arroyo, M., Iiboshi, K., Sato, M.(2012) Computational Materials Science 52 90-94.
[23] A.K. Filippov, M.A. Fedorov. (2003)4-th International Conference on Electromagnetic Processing of Materials. EPM, 14-17 October, Lion, France, 131.
[24] A.K. Filippov, V.N. Pak. (2007) International Workshopon Fullerenes and Atomic Clusters. IWFAС, July 2-6, St.Petersburg, Russia, 211.
[25] Babaev, A.A., Khokhlachev,P.P.,Nikolaev,Yu.A., Terukov,E.I., Phreydin,A.B., Filippov,R.A., FiloppovA.K., Manabaev,N.K.(2012) Inorganic Materials. 48, 1124-1127.
[26] Babaev, A.A., Khokhlachev,P.P.,Nikolaev,Yu.A., Terukov,E.I., Phreydin,A.B., Filippov,R.A., FiloppovA.K., Manabaev, N.K..(2011) Journal Perspektivnye materially 13. 846-850.
[27] Babaev, A.A., Khokhlachev, P.P., Nikolaev, Yu.A., Terukov, E.I., Phreydin, A.B., Filippov, R.A., FiloppovA.K., Manabaev, N.K.(2012). Izvestiya RAN. Seriya Fizicheskaya, 76, 7, 961-964.
[28] Khvostantsev, L.G., Slesarev, V.N., and Brazhkin, V.V. (2004). High PressureResearch 24, 371-383.
[29] S. Kotosonov and V. V. Atrazhev, JETP Lett. 72 (2), 53 (2007).
[30] D. N. Weldon, W. J. Blau, and H. W. Zandlbergen, Chem. Phys. Lett. 241, 365 (1995).
[31] Sánchez-Gonzáleza, J.,Macías-Garcíaa, A.,Alexandre-Francob, M.F.,Gómez-Serrano, V. (2005) Carbon, 43, 741-747
[32] Ma, M.D., Liu, J. Z., Wang, L., Shen, L., Xie, L., Wei, F., Zhu, J., Gong, Q., Liang, J. and Zheng, Q. (2010) Physical Review B 81, 235420-5.
[33] Singh, L.T. and Nanda, K.K. (2012) AIP Advances 2, 022103-7.
600 ATLANTIC AVE, BOSTON,
MA 02210, USA
+001-6179630233
AIS is an academia-oriented and non-commercial institute aiming at providing users with a way to quickly and easily get the academic and scientific information.
Copyright © 2014 - American Institute of Science except certain content provided by third parties.